Standard

IEC 60410:1973 ED1

Jan 1973 Withdrawn

Corrigendums and amendments are bought separately.

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Abstract

Establishes sampling plans and procedures for inspection by attributes. These sampling plans are applicable, but not limited, to inspection of end items, components and raw materials, operations, materials in process, supplies in storage, maintenance operations, data or records and administrative procedures.

Document information

Standard from IEC
Published: 1 January 1973
Withdrawn: 30 October 2015
Edition: 1
Version: 1
Document type: IS
ISBN:

ICS 21.020
ICS 31.020
ISO TC TC 56

Product Relations

Referred by: NEK EN 61274-1:2008
Referred by: NEK EN 60874-1:2007
Referred by: NEK EN 60384-2:2005
Referred by: NEK EN 62276:2005
Referred by: NEK EN 61314-1:2005
Referred by: NEK EN 60086-3:2005
Referred by: NEK EN 60939-1:2005
Referred by: NEK EN 60758:2005
Referred by: NEK EN 60384-22:2004
Referred by: NEK EN 60384-21:2004
Referred by: NEK EN 61951-1:2003
Referred by: NEK EN 61951-2:2003
Referred by: NEK EN 60770-2:2003
Referred by: NEK EN 62246-1:2002
Referred by: NEK EN 62134-1:2002
Referred by: NEK EN 60876-1:2001

IEC 60410:1973 ED1

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Abstract

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Abstract

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