Standard

IEC 60747-18-1:2019 ED1

May 2019 Published

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Abstract

IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.

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Standard from IEC
Published: 20 May 2019
Edition: 1
Version: 1
Document type: IS
ISBN: 9782832269091

ICS 31.080.99
ISO TC TC 47/SC 47E

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Adopted by: NEK IEC 60404-8-4:1998

IEC 60747-18-1:2019 ED1

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Abstract

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