Standard

IEC PAS 62336:2002 ED1

Aug 2002 Replaced

Corrigendums and amendments are bought separately.

Language English

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Abstract

Used to identify failure mechanisms internal to packages, the unbiased HAST aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Document information

Standard from IEC
Published: 15 August 2002
Withdrawn: 9 March 2004
Edition: 1
Version: 1
Document type: PAS
ISBN: 2831865271

ICS 31.080.01
ISO TC TC 47

Product Relations

Replaced by: IEC 60749-24:2004 ED1

Product life cycle

Current product

Replaced

IEC PAS 62336:2002 ED1
Stage 99.60
Replaced by

Revised

IEC 60749-24:2004 ED1

IEC PAS 62336:2002 ED1

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Abstract

Document information

Product Relations

Product life cycle

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

Extended editions Extended editions (0)

Version history Related corrigendum and amendments (0)

Abstract

Document information

Product Relations

Product life cycle