Standard

IEC TR 62433-4-1:2025 ED1

Aug 2025 Published

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Language English

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Abstract

IEC TR 62433-4-1:2025 provides an overview of good practices to extract an ICIM-CI model from measurements and to build a numerical model of the PCB in which the ICIM-CI model is used to predict RF immunity of an IC in its application PCB. This document also discusses factors which can be considered to obtain proper results in an ICIM-CI model extraction and use of the actual model at the PCB level.

Document information

Standard from IEC
Published: 26 August 2025
Edition: 1
Version: 1
Document type: TR
ISBN: 9782832706633

ICS 31.200
ISO TC TC 47/SC 47A

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Adopted by: NEK IEC 60320-2-1:2018

IEC TR 62433-4-1:2025 ED1

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Abstract

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Abstract

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