Standard

NEK EN 60444-11:2010

Dec 2010 Published

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Abstract

IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.

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Standard from NEK
Published: 1 December 2010
Edition: 2010-11
Version: 1
Document type: NAT
ISBN:

ICS 31.140
National Committee NEK/NK49

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Replaced by: NEK EN IEC 60444-11:2026
Refers: NEK EN 60122-1:2002
Refers: NEK EN 60444-4:1997
Refers: NEK EN 60444-5:1997
Adopted from: EN 60444-11:2010 , 0

NEK EN 60444-11:2010

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Abstract

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