Standard

NEK EN 60749-22:2003

Jun 2003 Published

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Abstract

Applicable to semiconductor devices (discrete devices and integrated circuits), this test measures bond strength or determine compliance with specified bond strength requirements

Document information

Standard from NEK
Published: 20 June 2003
Edition: 2003-06
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

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Replaced by: NEK EN IEC 60749-22-2:2026
Replaced by: NEK EN IEC 60749-22-1:2026
Referred by: NEK EN IEC 62787:2021
Referred by: NEK EN 62047-4:2010
Adopted from: EN 60749-22:2003 , 0

NEK EN 60749-22:2003

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Abstract

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Abstract

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