Standard

NEK EN 62220-1:2004

Jan 2004 Withdrawn

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Abstract

Specifies the method for the determination of the detective quantum efficiency (DQE) of digital X-ray imaging devices as a function of exposure and of spatial frequency for the working conditions in the range of the medical application as specified by the manufacturer. Is applicable to projection digital X-ray imaging devices producing images in digital format that are used for medical diagnosis. It is restricted to digital X-ray imaging devices that are used for radiographic imaging, such as CR systems, selenium-based systems, flat panel detectors, optically coupled CCD detectors, and digital X-ray image intensifiers used for single exposures.

Document information

Standard from NEK
Published: 14 January 2004
Withdrawn: 16 April 2018
Edition: 1
Version: 1
Document type: NAT
ISBN:

ICS 11.040.50
National Committee NEK/NK62

Legal references

EU law: 93/42/EEC

Product Relations

Replaced by: NEK EN 62220-1-1:2015
Adopted from: EN 62220-1:2004 , 0

NEK EN 62220-1:2004

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Abstract

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