Standard

NEK EN IEC 62496-2-5:2023

Jan 2023 Published

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Abstract

This part of IEC 62496-2 defines a test method for folding flexibility inspection of flexible opto-electric circuits with a MIT folding endurance tester and presents a guideline for a step stress test method for finding the predetermined minimum mechanical folding radii below which the flexible opto-electric circuits can be damaged by intended folding distortion. Here, test samples are used instead of products for the flexibility test of their flexible opto-electric circuits, and the test samples have the same layer structure as the products.

Document information

Standard from NEK
Published: 26 January 2023
Edition: 2023-01
Version: 1
Document type: NAT
ISBN:

ICS 33.180.01
National Committee NEK/NK86

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Refers: NEK EN IEC 60793-2-60:2025
Adopted from: EN IEC 62496-2-5:2023 , 0

NEK EN IEC 62496-2-5:2023

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Abstract

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