Standard

NEK IEC 60147-4:1976

Jan 1976 Withdrawn

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Abstract

Gives conditions for electrical tests, for different temperature conditions and for different durations, as well as failure-defining characteristics and failure criteria, which are standardized for each device category. This permits a unique and easy comparison of data presented by different manufacturers, relative to acceptance testing as well as to reliability testing. Deals with semiconductor devices and digital integrated circuits (bipolar, MOS, multi-chip and hybrid circuits).

Document information

Standard from NEK
Published: 1 January 1976
Withdrawn: 3 July 2013
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 31.080.10
National Committee TC 47

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Adopted from: IEC TR 60083:1997 ED3

NEK IEC 60147-4:1976

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Abstract

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Abstract

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