Standard

NEK IEC 60510-1-4:1986

Jan 1986 Published

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Language English

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Abstract

Deals with basic measurements which are equally applicable to a sub-system such as an amplifier, or to a combination of sub-systems assembled to simulate a satellite earth station. Methods of measurements are described for the following parameters: -input and output impedance (return loss); -input and output levels; -baseband gain or loss; -amplitude/frequency characteristic; -group-delay/frequency characteristic; -non-linear amplitude distortion; -differential gain and phase distortion.

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Standard from NEK
Published: 1 January 1986
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 33.060.30
National Committee TC 102

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Adopted from: IEC 60268-16:1988 ED1

NEK IEC 60510-1-4:1986

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Abstract

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Abstract

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