Standard

NEK IEC TR 62878-2-2:2015

Dec 2015 Published

Corrigendums and amendments are bought separately.

Language English

Services Read Online (No printing ) kr 1 303,00 Printed and bound Delivery time: 5-10 days kr 1 629,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

Document information

Standard from NEK
Published: 4 December 2015
Edition: 1.0
Version: 1
Document type: TR
ISBN:

ICS 31.180
ICS 31.190
National Committee NEK/NK91

Product Relations

Adopted from: IEC 61851-25:2020 ED1
Adopted from: IEC TR 62878-2-2:2015

NEK IEC TR 62878-2-2:2015

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

Abstract

Document information

Product Relations

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

Extended editions Extended editions (0)

Version history Related corrigendum and amendments (0)

Abstract

Document information

Product Relations