Standard

NS-EN ISO 3274:1997

Sept 1998 Withdrawn

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Abstract

Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.

Document information

Standard from SN
Published: 9 September 1998
Withdrawn: 10 March 2025
Edition: 1997-11
Version: 1
Document type: NAT
ISBN:

ICS 17.040.30
National Committee CEN/TC 290

Product Relations

Replaced by: NS-EN ISO 25178-601:2025
Referred by: NEK EN 61952:2003
Adopted from: EN ISO 3274:1997 , 0

Product life cycle

Current product

Withdrawn

NS-EN ISO 3274:1997
Replaced by

Draft

prNS-EN ISO 25178-601:2023

Published

NS-EN ISO 25178-601:2025

NS-EN ISO 3274:1997

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Abstract

Document information

Product Relations

Product life cycle

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Abstract

Document information

Product Relations

Product life cycle