Standard

IEC 60748-2-20:2000 ED1

Oct 2000 Revised

Note: This standard has a new edition: IEC 60748-2-20:2008 ED2

Corrigendums and amendments are bought separately.

Language English/French

Services Read Online (No printing ) kr 324,00 Printed and bound Delivery time: 5-10 days kr 404,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

The dimensions of integrated circuit devices being continually reduced, to obtain better performance and higher density, the electric fields within the die will increase, which leads to reduced reliability. This standard aims at giving interface specifications for various sets of values, where each comprises the nominal value of power supply voltage, its tolerances, and the worst-case limit values of the input and output voltages for low voltage integrated circuits.

Document information

Standard from IEC
Published: 18 October 2000
Withdrawn: 27 February 2008
Edition: 1
Version: 1
Document type: IS
ISBN: 2831854512

ICS 31.200
ISO TC TC 47/SC 47A

Product Relations

Adopted by: NEK IEC 61400-1:2005+A1:2010 CSV
Revised by: IEC 60748-2-20:2008 ED2

Product life cycle

Current product

Revised

IEC 60748-2-20:2000 ED1
Stage 99.60
Revised by

Published

IEC 60748-2-20:2008 ED2

IEC 60748-2-20:2000 ED1

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

IEC 60748-2-20:2008 ED2