Standard

IEC 61124:1997 ED1

Jul 1997 Revised

Note: This standard has a new edition: IEC 61124:2023 ED4

Corrigendums and amendments are bought separately.

Language English/French

Services Read Online (No printing ) kr 4 599,00 Printed and bound Delivery time: 5-10 days kr 5 749,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

Specifies procedures to test whether an observed value of: - failure rate; - failure intensity; - mean time to failure; - mean operating time between failures; complies with a given requirement. Three types of test plans are prescribed as follows: - sequential test plans; - time/failure terminated test plan; - fixed calendar time/failure terminated test plans. Cancels and replaces IEC 60605-7, published in 1978, and its amendment 1 (1990), of which its constitutes a technical revision.

Document information

Standard from IEC
Published: 30 July 1997
Withdrawn: 15 March 2006
Edition: 1
Version: 1
Document type: IS
ISBN: 2831839106

ICS 03.120.30
ICS 19.020
ICS 21.020
ISO TC TC 56

Product Relations

Adopted by: NEK IEC TR 62544:2011
Revised by: IEC 61124:2006 ED2
Replaces: IEC 60605-7:1978 ED1

Product life cycle

Previous product

Replaced

IEC 60605-7:1978/AMD1:1990 ED1

Replaced

IEC 60605-7:1978 ED1
Current product

Revised

IEC 61124:1997 ED1
Stage 99.60
Revised by

Revised

IEC 61124:2006 ED2

IEC 61124:1997 ED1

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

IEC 61124:2023 ED4

IEC 61124:2012 ED3

IEC 61124:2006 ED2