Standard

IEC 61726:1999 ED2

Nov 1999 Revised

Note: This standard has a new edition: IEC 61726:2022 ED4

Corrigendums and amendments are bought separately.

Language English English/French

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Abstract

Describes the measurement of screening attenuation by the reverberation, or stirred, chamber, suitable for virtually any type of microwave component and having no theoretical upper frequency limit. It is only limited toward low frequencies due to the size of the test equipment, which is frequency dependent and is only one of several methods of measuring sreening attenuation. For the purpose of this standard, examples of microwave components are waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners, etc.

Document information

Standard from IEC
Published: 30 November 1999
Withdrawn: 8 September 2015
Edition: 2
Version: 1
Document type: IS
ISBN: 283185038X

ICS 33.120.10
ICS 33.120.30
ISO TC TC 46/SC 46A

Product Relations

Revised by: IEC 61726:2015 ED3
Replaces: IEC TR 61726:1995 ED1

Product life cycle

Previous product

Replaced

IEC TR 61726:1995 ED1
Current product

Revised

IEC 61726:1999 ED2
Stage 99.60
Revised by

Revised

IEC 61726:2015 ED3

IEC 61726:1999 ED2

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IEC 61726:2022 ED4

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