Standard

IEC TS 61994-4-4:2010 ED2

Jun 2010 Revised

Note: This standard has a new edition: IEC TS 61994-4-4:2018 ED3

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Abstract

IEC 61994-4-4:2010(E) specifies the terms and definitions for single crystal wafers applied for surface acoustic wave (SAW) devices representing the state of the art, which are intended for use in the standards and documents of IEC technical committee 49. This second edition cancels and replaces the first edition published in 2005. The main changes with respect to the previous edition are listed below: - Terms and definitions are rearranged in accordance with the order of the alphabet. - "reduced LN" is appended to terms and definitions. - "reduced LT" is appended to terms and definitions. - reduction process is appended to terms and definitions.

Document information

Standard from IEC
Published: 24 June 2010
Withdrawn: 16 November 2018
Edition: 2
Version: 1
Document type: TS
ISBN: 9782889120222

ICS 01.040.31
ICS 31.140
ISO TC TC 49

Product Relations

Revised by: IEC TS 61994-4-4:2018 RLV
Revised by: IEC TS 61994-4-4:2018 ED3
Revises: IEC TS 61994-4-4:2005 ED1
Adopted by: NEK IEC 60728-4:1997
Adopted by: NEK IEC 60873:1986

Product life cycle

Previous product

Revised

IEC TS 61994-4-4:2005 ED1
Current product

Revised

IEC TS 61994-4-4:2010 ED2
Stage 99.60
Revised by

Published

IEC TS 61994-4-4:2018 RLV

Published

IEC TS 61994-4-4:2018 ED3

IEC TS 61994-4-4:2010 ED2

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IEC TS 61994-4-4:2018 ED3