Amendment

NEK EN 60749-23:2004/A1:2011

Apr 2011 Published

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Abstract

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

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Amendment from NEK
Published: 1 April 2011
Edition: 2011-03
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

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Replaced by: NEK EN IEC 60749-23:2026
Referred by: NEK EN 62047-4:2010
Adopted from: EN 60749-23:2004/A1:2011 , 0

NEK EN 60749-23:2004/A1:2011

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Abstract

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