Standard

NEK EN IEC 60749-23:2026

Mar 2026 Published

Corrigendums and amendments are bought separately.

Language English

Services Read Online (No printing ) kr 687,00 Printed and bound Delivery time: 5-10 days kr 858,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

IEC 60749-23:2025 specifies the test used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as "burn-in", can be used to screen for infant-mortality related failures. The detailed use and application of burn-in is outside the scope of this document.This edition includes the following significant technical changes with respect to the previous edition:a) absolute stress test definitions and resultant test durations have been updated.

Document information

Standard from NEK
Published: 23 March 2026
Edition: 2026-01
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Referred by: NEK EN IEC 63287-1:2021
Referred by: NEK EN IEC 60749-41:2020
Referred by: NEK EN 60749-43:2017
Adopted from: EN IEC 60749-23:2026

NEK EN IEC 60749-23:2026

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer