Standard

NEK EN 60749-37:2008

May 2008 Withdrawn

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Abstract

Provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface-mounted components while producing the same failure modes normally observed during product level test.

Document information

Standard from NEK
Published: 1 May 2008
Withdrawn: 16 November 2025
Edition: 2008-04
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

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Replaced by: NEK EN IEC 60749-37:2022
Refers: NEK EN 60749-20-1:2009
Adopted from: EN 60749-37:2008 , 0

NEK EN 60749-37:2008

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Abstract

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Abstract

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