Standard

NEK EN IEC 60749-37:2022

Nov 2022 Published

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Language English

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Abstract

NEW! IEC 60749-37:2022 is available as IEC 60749-37:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition. IEC 60749-37:2022 provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface-mounted components while producing the same failure modes normally observed during product level test. This edition includes the following significant technical changes with respect to the previous edition: - correction of a previous technical error concerning test conditions; - updates to reflect improvements in technology.

Document information

Standard from NEK
Published: 24 November 2022
Edition: 2022-11
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Refers: NEK EN IEC 60749-20-1:2026
Replaces: NEK EN 60749-37:2008
Adopted from: EN IEC 60749-37:2022 , 0

NEK EN IEC 60749-37:2022

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