Standard

NEK EN 60749-7:2002

Aug 2002 Withdrawn

Note: This standard has a new edition: NEK EN 60749-7:2011

Corrigendums and amendments are bought separately.

Language English

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Abstract

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

Document information

Standard from NEK
Published: 14 August 2002
Withdrawn: 22 July 2014
Edition: 1
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK EN 60749-7:2011
Referred by: NEK EN 62047-4:2010
Referred by: NEK EN 62149-3:2004
Adopted from: EN 60749-7:2002 , 0

NEK EN 60749-7:2002

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NEK EN 60749-7:2011