Standard

NEK EN 61280-2-2:2012

Jan 2013 Published

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Abstract

IEC 61280-2-2:2012(E) describes a test procedure to verify compliance with a predetermined waveform mask and to measure the eye pattern and waveform parameters such as rise time, fall time, modulation amplitude and extinction ratio. This fourth edition cancels and replaces the third edition published in 2008 and constitutes a technical revision .This edition includes the following significant technical changes with respect to the previous edition: additional definitions; clarification of test procedures. Keywords: optical eye pattern, waveform, modulation amplitude, extinction ratio

Document information

Standard from NEK
Published: 1 January 2013
Edition: 1
Version: 1
Document type: NAT
ISBN:

National Committee NEK/NK86

Product Relations

Referred by: NEK CLC/TR 50083-10-1:2009
Replaces: NEK EN 61280-2-2:2008
Adopted from: EN 61280-2-2:2012 , 0

NEK EN 61280-2-2:2012

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