Standard

NEK EN 62132-4:2006

May 2006 Published

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Language English

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Abstract

Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.

Document information

Standard from NEK
Published: 19 May 2006
Edition: 1
Version: 1
Document type: NAT
ISBN:

ICS 31.200
National Committee NEK/NK47

Legal references

EU law: 2004/108/EC, 2014/30/EU

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Refers: NEK EN 55016-1-2:2004
Adopted from: EN 62132-4:2006 , 0

NEK EN 62132-4:2006

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Abstract

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Abstract

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