Standard

NEK EN 62132-4:2006

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Omfang

Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.

Dokumentinformasjon

  • Standard fra NEK
  • Publisert:
  • Utgave: 1
  • Versjon: 1
  • Varetype: NAT
  • ICS 31.200
  • National Committee NEK/NK47

Referanser i lov

EU lov: 2004/108/EC, 2014/30/EU

Produktrelasjon