Standard

NEK IEC 60427:1973

Jan 1973 Withdrawn

Note: This standard has a new edition: NEK IEC 60427:2000

Corrigendums and amendments are bought separately.

Language English

Services Read Online (No printing ) kr 4 297,00 Printed and bound Delivery time: 5-10 days kr 5 371,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

Applies to a.c. circuit-breakers within the scope of IEC 56 (Clause 1). It provides the general rules for testing a.c. circuit-breakers, for making and breaking capacities over the range of test-duties described in Subclauses 6.102 to 6.111 of IEC 56, by synthetic methods. The purpose of this standard is to establish criteria for synthetic testing and for the proper evaluation of results. Such criteria will establish the validity of the test method without imposing restraints on innovation of test circuitry.

Document information

Standard from NEK
Published: 1 January 1973
Withdrawn: 13 March 2015
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 29.130.10
National Committee TC 17/SC 17A

Product Relations

Adopted from: IEC 62539:2007 ED1
Replaced by: NEK IEC 60427:1989

NEK IEC 60427:1973

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

NEK IEC 60427:2000

NEK IEC 60427:1989