Standard

NEK IEC 60749-26:2006

Jul 2006 Withdrawn

Note: This standard has a new edition: NEK IEC 60749-26:2025

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Language English

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Abstract

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.

Document information

Standard from NEK
Published: 18 July 2006
Withdrawn: 23 April 2013
Edition: 2.0
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60749-26:2013
Replaces: NEK IEC 60749-26:2003
Adopted from: IEC 60749-26:2006

NEK IEC 60749-26:2006

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NEK IEC 60749-26:2025

NEK IEC 60749-26:2018

NEK IEC 60749-26:2013