Standard

NEK IEC 60749-32:2002

Published

Note: This standard has a new edition: NEK IEC 60749-32:2002+A1:2010 CSV

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Corrigendums and amendments are bought separately.

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Abstract

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. The contents of the corrigendum of August 2003 have been included in this copy.

Document information

  • Standard from NEK
  • Published:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • ICS 31.080.01
  • National Committee NEK/NK47

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