Standard

NEK IEC PAS 62180:2000

Aug 2000 Withdrawn

Corrigendums and amendments are bought separately.

Language English

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Abstract

Establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined machine Model (MM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable MM ESD test results so that accurate classifications can be performed.

Document information

Standard from NEK
Published: 22 August 2000
Withdrawn: 22 October 2003
Edition: 1.0
Version: 1
Document type: PAS
ISBN:

ICS 31.080.01
National Committee TC 47

Product Relations

Replaced by: NEK IEC 60749-27:2003
Adopted from: IEC PAS 62180:2000

NEK IEC PAS 62180:2000

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Abstract

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Abstract

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