Standard

NEK IEC 60749-27:2003

Oct 2003 Withdrawn

Note: This standard has a new edition: NEK IEC 60749-27:2006+A1:2012 CSV

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Abstract

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the human body model (see IEC 60749-26).

Document information

Standard from NEK
Published: 21 October 2003
Withdrawn: 18 July 2006
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60749-27:2006
Replaces: NEK IEC PAS 62180:2000
Adopted from: IEC 60749-27:2003

NEK IEC 60749-27:2003

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NEK IEC 60749-27:2006+A1:2012 CSV

NEK IEC 60749-27:2006