Consolidated

NEK IEC 60749-27:2006+A1:2012 CSV

Sept 2012 Published

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Language English

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Abstract

IEC 60749-27:2006+A1:2012 Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive. This consolidated version consists of the second edition (2006) and its amendment 1 (2012). Therefore, no need to order amendment in addition to this publication.

Document information

Consolidated from NEK
Published: 25 September 2012
Edition: 2.1
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Merges: NEK IEC 60749-27:2006
Adopted from: IEC 60386:1972 ED1

NEK IEC 60749-27:2006+A1:2012 CSV

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