Standard

NEK IEC PAS 62189:2000

Nov 2000 Withdrawn

Corrigendums and amendments are bought separately.

Language English

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Abstract

This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.

Document information

Standard from NEK
Published: 28 November 2000
Withdrawn: 4 September 2014
Edition: 1.0
Version: 1
Document type: PAS
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60749-23:2004+A1:2011 CSV
Replaced by: NEK IEC 60749-23:2004
Replaced by: NEK IEC 60749-23:2004
Adopted from: IEC PAS 62189:2000

NEK IEC PAS 62189:2000

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Abstract

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Abstract

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