Standard

NEK IEC 60749-23:2004

Withdrawn

Note: This standard has a new edition: NEK IEC 60749-23:2025

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Abstract

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

Document information

  • Standard from NEK
  • Published:
  • Withdrawn:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • ICS 31.080.01

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