Standard

NEK IEC TS 61994-4-4:2010

Jun 2010 Withdrawn

Note: This standard has a new edition: NEK IEC TS 61994-4-4:2018

Corrigendums and amendments are bought separately.

Language English

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Abstract

IEC 61994-4-4:2010(E) specifies the terms and definitions for single crystal wafers applied for surface acoustic wave (SAW) devices representing the state of the art, which are intended for use in the standards and documents of IEC technical committee 49. This second edition cancels and replaces the first edition published in 2005. The main changes with respect to the previous edition are listed below: - Terms and definitions are rearranged in accordance with the order of the alphabet. - "reduced LN" is appended to terms and definitions. - "reduced LT" is appended to terms and definitions. - reduction process is appended to terms and definitions.

Document information

Standard from NEK
Published: 24 June 2010
Withdrawn: 16 November 2018
Edition: 2.0
Version: 1
Document type: TS
ISBN:

ICS 01.040.31
ICS 31.140
National Committee NEK/NK49

Product Relations

Replaced by: NEK IEC TS 61994-4-4:2018
Replaced by: NEK IEC 62830-1:2017
Replaces: NEK IEC TS 61994-4-4:2005
Adopted from: IEC 60923:1988 ED1
Adopted from: IEC TS 61994-4-4:2010

NEK IEC TS 61994-4-4:2010

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NEK IEC TS 61994-4-4:2018