Standard

ISO 29301:2010

Tilbaketrukket

Merknad: Denne standarden har en ny utgave: ISO 29301:2023

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ISO 29301:2010 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. ISO 29301:2010 is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. ISO 29301:2010 also refers to the calibration of a scale bar. ISO 29301:2010 does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM)

Dokumentinformasjon

  • Standard fra ISO
  • Publisert:
  • Tilbaketrukket:
  • products.specs.Expires:
  • Utgave: 1
  • Versjon: 1
  • Varetype: IS
  • ICS 37.020
  • ISO TC ISO/TC 202/SC 3

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