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NEK IEC 62899-402-1:2025

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IEC 62899-402-1:2025 specifies the measurement methods of the width of line pattern and spaces between the line patterns in printed electronics. These printed line patterns are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for vertical variance in printed electronics.This edition includes the following significant technical changes with respect to the previous edition:a) The title is changed from 'Printability – Measurement of qualities – Pattern width' to 'Printability – Measurement of qualities – Line pattern width'b) The term 'pattern width' is specified as 'line pattern width'.c) The measurement method of line pattern space is included.d) The definition and measurement of inner/outer edge lines are removed.

Dokumentinformasjon

  • Standard fra NEK
  • Publisert:
  • Utgave: 2.0
  • Versjon: 1
  • Varetype: NAT
  • ICS 31.180

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