Standard

IEC 60747-9:1998 ED1

Aug 1998 Revised

Note: This standard has a new edition: IEC 60747-9:2019 ED3

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Abstract

Gives product specific standards for terminology, letter symbols, essential ratings and characteristics and measuring methods for insulated-gate bipolar transistors (IGBTs).

Document information

Standard from IEC
Published: 28 August 1998
Withdrawn: 26 September 2007
Edition: 1
Version: 1
Document type: IS
ISBN: 2831844657

ICS 31.080.30
ISO TC TC 47/SC 47E

Product Relations

Revised by: IEC 60747-9:2007 ED2
Referred by: NEK EN 60747-15:2004

Product life cycle

Current product

Revised

IEC 60747-9:1998 ED1
Stage 99.60

Amendments

Revised

IEC 60747-9:1998/AMD1:2001 ED1
Revised by

Revised

IEC 60747-9:2007 ED2

IEC 60747-9:1998 ED1

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IEC 60747-9:2019 ED3

IEC 60747-9:2007 ED2

IEC 60747-9:1998+AMD1:2001 CSV

IEC 60747-9:1998 ED1

Abstract

Document information

Product Relations

Product life cycle

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

Extended editions Extended editions (0)

Version history Related corrigendum and amendments (1)

IEC 60747-9:1998/AMD1:2001 ED1

Version history History (4)

IEC 60747-9:2019 ED3

IEC 60747-9:2007 ED2

IEC 60747-9:1998+AMD1:2001 CSV

IEC 60747-9:1998 ED1

Abstract

Document information

Product Relations

Product life cycle