Consolidated

IEC 60747-9:1998+AMD1:2001 CSV

Nov 2001 Revised

Note: This standard has a new edition: IEC 60747-9:2019 ED3

Corrigendums and amendments are bought separately.

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Abstract

Gives product specific standards for terminology, letter symbols, essential ratings and characteristics and measuring methods for insulated-gate bipolar transistors (IGBTs). This consolidated version consists of the first edition (1998) and its amendment 1 (2001). Therefore, no need to order amendment in addition to this publication.

Document information

Consolidated from IEC
Published: 20 November 2001
Withdrawn: 26 September 2007
Edition: 1.1
Version: 1
Document type: IS
ISBN: 2831859913

ICS 31.080.30
ISO TC TC 47/SC 47E

Product Relations

Revised by: IEC 60747-9:2007 ED2
Referred by: NEK EN 60747-15:2004

Product life cycle

Current product

Revised

IEC 60747-9:1998+AMD1:2001 CSV
Revised by

Revised

IEC 60747-9:2007 ED2

IEC 60747-9:1998+AMD1:2001 CSV

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IEC 60747-9:2019 ED3

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