Standard

NEK EN 60749-6:2002

Aug 2002 Withdrawn

Note: This standard has a new edition: NEK EN 60749-6:2017

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Language English

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Abstract

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

Document information

Standard from NEK
Published: 13 August 2002
Withdrawn: 7 April 2020
Edition: 2002-08
Version: 1
Document type: NAT
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK EN 60749-6:2017
Referred by: NEK EN 60747-15:2004
Adopted from: EN 60749-6:2002 , 0

NEK EN 60749-6:2002

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NEK EN 60749-6:2017